> heavy use mostly doesn't apply to solid-state devices
Sorry, but this is pretty much incorrect. Copper migrates, even in solid state devices, and those copper migrations cause breaks and shorts, which cause errors and failures. The smaller the scale, the faster this happens. There is absolutely a MTBF even for solid-state devices.
This entire slide deck is worth the perusal, if only for the "whoah, that actually happens?!" moments. But here's a relevant slide for this claim:
Sorry, but this is pretty much incorrect. Copper migrates, even in solid state devices, and those copper migrations cause breaks and shorts, which cause errors and failures. The smaller the scale, the faster this happens. There is absolutely a MTBF even for solid-state devices.
This entire slide deck is worth the perusal, if only for the "whoah, that actually happens?!" moments. But here's a relevant slide for this claim:
https://c3.ndc.nasa.gov/dashlink/static/media/other/Observed...
The money quote: "Commercial semiconductor road maps show component reliability timescales are being reduced to 5-7 years." (with attribution)
Another fascinating slide is this one, which shows how an IC can start to have a timing issue after being in service for a time.
https://c3.ndc.nasa.gov/dashlink/static/media/other/Observed...